Improved measurement uncertainty for all Si sensors and classification A

The measurement uncertainty of Si sensors with voltage output (Si-V-XX) is now ± 4.0 W/qm ± 1.6% from reading and with current output (Si-I-XX ± 4.5 W/qm ± 1.6% from reading.

Now all our Si sensor are class A as per IEC 61724-1.

The measurement uncertainty of each sensor type is listed in the new data sheet.

Our digital Si sensor are already classified as class A with a now improved measurement uncertainty of ± 0.4 W/qm ± 1.6% from reading.

This new improve measurement uncertainties are valid for the whole working temperature range, spectrum AM1.5 and vertical light beam. The calculation was done according to GUM (Guide to the Expression of Uncertainty in Measurement) with k=2.

We are continuously working on the improvement of our Si sensors. Achieving this high accuracy we are calibrating further on with a reference cell calibrated at the Physikalisch Technischen Bundesanstalt (PTB, National Metrology Institute of Germany).